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Standard: IEC 335-1, Ed.2 . u$ \' N+ d* e3 B0 m
Sub clause: 30.39 |( b9 J0 h& P1 b+ u( P+ r( d
Sheet n. 253 A
+ x7 b1 [ V' b# M7 y$ ZSubject: Resistance to tracking + g# o; ?% Q8 {
Key words:0 h8 }; I! h. d2 Q* b' P; b
- tracking; d+ T( j. c @9 Y4 M) b+ E. I
Decision 16 of 34th meeting/1997
3 n. S% ~. T+ b) }8 w7 E6 p( ]0 x ZQuestion:
3 `6 M3 u3 p, I4 B* n+ p* ], z8 S" BWhat is the minimum potential below which a tracking path is not any more liable to
* O' T! N" H H: ]" _# T9 @7 a+ Xoccur and therefore the test is not necessary ?# n8 T/ y# \2 G, \" L& d" S% ?
Decision:/ {3 U6 M7 ]5 D$ t2 B, b
Based on subclauses 2.9.4, note 1, and 8.1.4, no tracking test is needed for SELV- a$ L4 R) Y! w+ x; A
and PELV circuits.2 Y0 Z/ N8 o5 x# Z
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