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Question
0 Q9 O) j: K/ [! x' U3 RIn which way shall the temperature rise test be carried out on a device composed of two or more
; O _+ p5 b, w) Tswitches, having the same or different pattern number mounted on a common body?
/ y9 D. w6 l; t9 U0 K$ u7 DThe construction is allowed in note 1 of sub-clause 7.1.1, but the testing conditions are interpretable
. [1 s- z6 x. x5 |7 p3 y5 _in different ways in clause 17.1." P9 Q# b; O$ ^; ^" E
Decision
( \ u8 A0 e+ a$ K, hThe temperature rise test shall be performed separately on each individual switch on condition that it
. @! o9 E0 |7 Q1 gis a single-phase switch.
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* ?0 {& p0 b0 |: T4 a
" ^1 h5 `5 R' u/ ^, B1 E Q0 u3 I9 F& F- q* Y4 F
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