|
| DSH 457
. ~+ G+ j% T7 c) `% K' G. \" U& v2 p4 T$ e; E. S- X- T
1 T' E% m6 q4 L+ ?6 x
| Abnormal operation
7 G5 X9 j. K' M5 }6 A/ n5 ^ | 19' e- f0 t% M8 q7 y! D/ A
| 60335-1(ed.2)
* [ S3 ]' R& P( d2 u# Z | ) k& b p7 f# P! {
Standard: IEC 60335-1:1976, 2nd Ed.2 z* E1 j) x7 ?+ ^. h0 O' r6 N0 f6 [
Sub clause: 19
; ^$ T7 X6 ?, w+ b4 wSheet No. DSH-457
, N* A( D& Q+ _6 x) M) R- J& tSubject: Abnormal operation5 f+ e6 ~ X! ~' U- d$ k+ z+ x
Key words: - thermostat an thermal cut out within the same component* A' T/ K2 h+ v; ^# p* k( x9 r
Decision taken at the 40th CTL meeting 2003* q% ^6 b! c. ?4 c
Question:% c/ [. q) H$ t% f
How is a component with a thermostat or thermal cut-out or both within the same
- f5 j7 f- H4 {) P4 |$ H( tcomponent, having only one temperature sensing device, but operating two or more switch8 P0 r. c6 s; S$ C T) B
parts in separate circuits tested?/ Q4 f4 B: R& o" {9 x6 a
Rationale:
0 P+ C) z, O7 n% t6 z3 ^See question., K2 W+ {% @4 x) K8 y* l* Y$ _
Decision:* d% Y, ^5 v) T2 N
When a part of this component has to be short-circuited during the tests, all switch parts are. L: g; m' w/ R+ |% V
short-circuited. b8 S! Q1 ~7 T
7 @% M% V: X) ?% u6 u6 j
9 G; g. L' [! @& b" t5 ]
|
本帖子中包含更多资源
您需要 登录 才可以下载或查看,没有账号?注册安规
x
|