|
| DSH 4574 Y0 P( N- J# g& R0 I+ ^* ~. _
5 I9 z8 ~( I" d/ N( V
) |+ S# Z4 [$ W, |& u& f | Abnormal operation
3 j: ]' [6 t" y | 19: ~$ S: n( h+ D: b% Y% n- ]
| 60335-1(ed.2)
* A* z* l4 ^0 e' C% Z4 h" |9 Y* D | 4 [$ |- k# _) P- L
Standard: IEC 60335-1:1976, 2nd Ed.1 {/ r2 @; g, u3 I
Sub clause: 193 `2 a8 H6 R7 s% u" u9 H
Sheet No. DSH-457
3 `1 @' z5 e! t' zSubject: Abnormal operation% Q P0 u9 m9 S% P6 |7 z/ r; s2 }
Key words: - thermostat an thermal cut out within the same component7 ]' G2 ^5 |( C+ q9 M; x9 Z& V6 m
Decision taken at the 40th CTL meeting 2003* Z4 |! E' z# n( [3 n
Question:
. V! N& P7 e" `8 I! d- _$ N$ gHow is a component with a thermostat or thermal cut-out or both within the same
9 s, s& v+ E. }5 ]& Z: o; \; wcomponent, having only one temperature sensing device, but operating two or more switch, d: S: |3 ~3 V+ v2 j- P
parts in separate circuits tested?
0 H# I; y, {; I' kRationale:
: K% A6 S! l. q& hSee question.6 P5 M; M' _( q2 s
Decision:
: s, R- L* E3 pWhen a part of this component has to be short-circuited during the tests, all switch parts are
2 l" W4 @1 R! J1 i2 `short-circuited.- D$ J4 l! g/ Y3 L/ N* h( L
, M- |7 \0 l6 o# g. o. P
5 I: ^# s6 [" J; q9 J6 ]
|
本帖子中包含更多资源
您需要 登录 才可以下载或查看,没有账号?注册安规
x
|