PDSH 1004 Use of the previous tested sample

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PDSH 1004 / l! X2 b' |4 c8 Y, {6 l: I ! a9 ]5 ^( R4 {9 s  ~

Use of the previous tested sample ; e* [+ j$ S% y0 p+ I! j( q9 L

17 7 \3 ^3 C" y' Y% s" h3 U

61048(ed.2) * m6 z1 G' ]5 N3 M' B& c' r

5 k4 ?5 E+ }( d, L7 V: W0 TStandard(s):
1 h, u$ a  L9 p( Y2 u1 A* G: aIEC 61048/2006
Subclause(s): 17
No. Year PDSH 1004 2010
7 w4 F. b5 r6 aCategory: LITE Developed by: ETF5 OSM/LUM
Subject:
Use of the previous tested sample
Key words:
- Test time
- Destruction test
+ B1 {5 u( {7 D" {) ?; ]; K- Proposal
/ H0 l0 T: E& V2 XTo be approved at the 49th CTL Plenary Meeting, in 2012
  k# p: G5 y2 k2 X5 ~3 c. V7 X* z9 _Question:
In order to reduce the test time and cost, would it be possible to perform the destruction test of § 17 on the
+ n# @/ W$ F' B& Wsamples used for the IEC 61049 (clause 8), compliance?
. x; Y% ^0 ^6 w; F1 Q- FDecision:
4 \7 }- E$ c8 d, w' E% rYes.
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