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|  PDSH 1004
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' v3 t% O" D7 U' p6 y/ { | Use of the previous tested sample! k4 H5 i3 s, n
| 17. c) L0 f) D. W$ [7 ~2 _
| 61048(ed.2)! T& l0 C6 W6 e! {2 o
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7 ~" w# y9 f) G% |% OStandard(s):
6 L2 ]7 p9 h& e1 q( J$ aIEC 61048/2006
' m( ]1 D9 @2 i7 s' FSubclause(s): 17
' G# y* I$ b9 y$ k7 P! @) YNo. Year PDSH 1004 2010
) n1 |8 a; O) v2 I: \$ Z7 gCategory: LITE Developed by: ETF5 OSM/LUM/ p2 J; ^2 H0 L% m% O6 g$ a
Subject:5 f% @4 }4 e& T- _9 v: \# B, q
Use of the previous tested sample
/ }* V, t6 f# E1 T- BKey words:
- ^+ L) K# S$ r) J3 {- Test time
- b8 p5 ~; \+ k4 k3 w9 C- Destruction test
7 w4 O; {% k. Z2 x- Proposal4 q# M3 |+ W/ H0 x! X( w
To be approved at the 49th CTL Plenary Meeting, in 2012
9 Y" _4 v1 B! u+ T5 R+ K! p3 ZQuestion:
) H; o5 k$ v8 g9 wIn order to reduce the test time and cost, would it be possible to perform the destruction test of § 17 on the. h: m3 B" ^2 o
samples used for the IEC 61049 (clause 8), compliance?
0 g3 y8 e* \- dDecision:+ z9 U/ M$ @6 n# n
Yes.
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发表于 2012-9-17 16:06
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