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|  PDSH 1004/ z% \0 l7 m! l8 D% q
; i6 v7 c! k0 [ | Use of the previous tested sample% `: F# M6 w/ x# |& j. a
| 17
& t z: M3 [8 `- K' V+ K" d | 61048(ed.2)
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Standard(s):
8 G" n& S* y' i C4 h" x: MIEC 61048/2006
: P9 Z7 F0 ` j' YSubclause(s): 17
- O' E2 n& [4 e$ n4 v2 {No. Year PDSH 1004 2010
7 Y* d3 j. }7 p* ECategory: LITE Developed by: ETF5 OSM/LUM6 z* K5 T* m* [9 p* I
Subject:
7 y7 w1 a! L+ K" R# b/ r! YUse of the previous tested sample' p' P& J* i& Z# z" _
Key words:
) C7 C$ h5 u6 k) {7 M, n7 t# E" V' J- Test time2 \6 ~1 v$ Z0 I z' Q
- Destruction test
" R# m7 [; z A6 V- Proposal9 A$ J6 i, M7 Z- V2 p4 {$ y' j
To be approved at the 49th CTL Plenary Meeting, in 2012! n5 X" f u' t. a8 {" n$ H
Question:, t- E% m$ H! p! y" D# `$ ]
In order to reduce the test time and cost, would it be possible to perform the destruction test of § 17 on the2 v S0 k o" }: g
samples used for the IEC 61049 (clause 8), compliance?
) s5 D8 p' J" J3 @1 KDecision: x! R4 N* g, w% X- N6 J% w
Yes.
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发表于 2012-9-17 16:06
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