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|  PDSH 1004
W8 {- Y0 z, X* h5 [& @
% k& E, E5 p9 d: z- ~8 g4 D2 r" G | Use of the previous tested sample
3 ~, [+ r; W* Q, O) m* [ | 17
( J, I- W8 [6 v) X | 61048(ed.2)" h2 l9 i' [/ u( d% `
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9 m, B7 B1 t8 E2 o6 S x. i4 z6 ~Standard(s):
$ C- D/ z1 @8 T3 i$ E. zIEC 61048/2006+ l$ l q5 W+ w
Subclause(s): 17* l' ~8 ?6 V! R0 q3 o& g7 W- V( y
No. Year PDSH 1004 20107 s* z% o6 S( p% i. K
Category: LITE Developed by: ETF5 OSM/LUM
5 [7 {" V$ k2 f+ L$ E- Y) oSubject:
4 `+ @* q' j3 a' y/ mUse of the previous tested sample
4 B3 f8 a' w6 \6 a6 |! A; ]Key words:# J( X9 s/ _ D0 U/ l: J
- Test time; z; X5 x9 y/ j; Q: f
- Destruction test F9 B4 D! g! r S: A/ v
- Proposal% u( u0 h5 C, i! o& R L @
To be approved at the 49th CTL Plenary Meeting, in 2012/ _3 |4 ~% }& G, r. w. H9 a: C0 q7 e
Question:4 b9 J' L- ~0 ^$ P- b& g: l% O
In order to reduce the test time and cost, would it be possible to perform the destruction test of § 17 on the0 `/ ?1 E; } I& C( N
samples used for the IEC 61049 (clause 8), compliance?
6 |; y R# J$ _' W6 v+ x# KDecision:! [) S2 w) P. {6 h
Yes.
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发表于 2012-9-17 16:06
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