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" z2 u7 w; P0 `8 |Standard(s):
+ o' i/ z5 C" x4 _IEC 60950 (1999) 3rd Ed.# I3 I. _' k+ b" @% Y% V
Sub clause(s):& f, p/ C, J( p
2.3.21 F2 r: t# n! I: N i$ _1 l
Sheet No.
2 x4 m. a0 N3 E g9 G( o! r395
y. B& }1 }! U9 Z- W9 JSubject:
}' p9 y; L! i& k+ TSeparation of TNV –3 and SELV9 `% _% ]# T( K0 v- c) ?
circuitry1 V$ L: l( D6 A& Y% }1 e$ D" x
Key words:3 S' N2 J# P) R( V) H
- Separation of TNV-3 circuit
0 X+ x$ i4 D9 O$ L5 L' g: a1 \and SELV circuit: }: w" E8 ~1 F* a5 Y R; u& ?
Decision taken at the 39th/ a# n" i' P6 l) y1 ^
meeting 2002; F1 u, d# T5 q$ L
Question:
* o4 U7 {* l4 W. x, X5 N3 E1. Is it permitted to demonstrate that a TNV -3 circuit is adequately separated from a SELV circuit by
# p* E6 n! Q: Smeans of single fault testing, in the situation where the spacings do not meet the requirements for basic
9 c0 |( `* ^5 ^5 uinsulation? (The dielectric strength test is still required under Subclause 6.2.1.)2 {/ z2 b( v* L" g
2. If so, is it required under the compliance paragraph to short circuit the insulation between the TNVcircuit. S& K9 {9 J. w7 s) s2 a2 v
and the SELV circuit at all points which do not meet the criteria for basic insulation, before ]* Y# i6 G& z0 m8 _3 B
carrying out the tests?
& }! ^* l* H" i! V2 q7 [3. If short circuiting the insulation before carrying out fault tests results in the equipment passing the tests,( T5 z2 K2 I4 q/ s0 ?- Y. ]: {5 Q+ m
whereas carrying out the fault tests without short circuiting the insulation would result in the equipment
0 V- j7 u2 n' k! r0 o n! }failing the test, should the insulation be short circuited?
) G; O5 f) V) V. J2 ~Rationale:* D; q5 v% F) m V/ c6 {
1. Paragraph 1 of Sub-clause 2.3.2 requires that separation between a TNV-3 and a SELV circuit be such. B) M9 z, A7 W
that in the event of a single fault, the SELV circuit remains below TNV-3 limits. Paragraph 2 of Subclause
( u7 N3 R" o* ~, |* ^4 p) {( y2.3.2 states that basic insulation will achieve this, but other solutions are not excluded.
* z S0 @1 ^& m3 {- XEquipment is not required to meet either Paragraph 2 or 3. It can meet the single fault conditions stated
7 k) F( H5 ^+ G% B) O( g4 R" P1 fin Paragraph one and in the compliance paragraph.
; C: p. G/ W0 u+ l5 I$ R2. According to the compliance paragraph, before carrying out the single fault tests, insulation which does9 p+ A) z1 g m0 O' }0 {8 _! E
not meet the requirements for basic insulation is short circuited. Presumably this does not mean that1 {, k5 Q$ g7 R2 o% L
short circuits are to be applied between all tracks and components in the entire TNV-3 and SELV) u0 M$ y. M+ T0 b" k
circuitry which do not meet basic insulation, but that the insulation at the point where the TNV-3 circuit
" i0 M6 k# q7 Z) U; Nmeets the SELV circuit is short-circuited.
$ {1 O: Q5 I9 M4 [' n1 W3. It is possible to envisage a situation where short circuiting the insulation between TNV-3 and SELV5 w, Q, ]3 z7 F7 f. G0 h
could cause the TNV-3 voltages to be lowered. Fault tests under this condition would not represent the
8 s9 P' ~/ y7 h. S+ a5 ]/ x" f4 Sworst case possible fault condition7 V4 F( B: k- G2 T2 Y% U8 Q
Decision:6 {8 ?6 b5 C% l1 Z0 L$ K
1. It is permitted to demonstrate compliance with Subclause 2.3.2 by means of single fault testing./ p1 W, e( @" N8 Q5 K3 \
The limits in 2.3.1.b) shall not be exceeded in normal or single fault conditions.2 `" b0 m( n9 }# v5 e6 e4 F8 {
2. Before carrying out single fault testing of components and insulation, insulation between TNV-3 and
8 X6 |7 V* g* _; K9 w) ]% `SELV circuits not meeting the requirements of Basic insulation should be short circuited if this results in* l/ d2 @2 U; _: _1 r
a worst case voltage measurement at accessible parts of SELV and TNV-1 circuits, and at accessible! f2 s6 _& A" Z
conductive parts during subsequent fault testing.+ w! N P" r& v9 K8 c
3. If the single fault test would be more severe if carried out without short circuiting the insulation, the test* N" U7 L& q8 q( u6 |
should be done without short circuiting the insulation.
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