|
| DSH 395
( C) k$ @. V9 d( m0 i6 {- V0 w* S) U" h* D& ^ o+ U
| Separation of TNV-3 and SELV circuitry/ Z' x7 s/ x2 m* I& f
| 2.3.2
6 n* }2 h1 T1 s9 `( f5 O; v | 60950(ed.3)$ L, E6 F. E6 I
|
L! ?% r4 ?& E/ P( ^Standard(s): \1 G" F& T$ P% q V
IEC 60950 (1999) 3rd Ed.
( L) T7 c# }0 N9 g# r: N# m4 mSub clause(s):- H# z6 w; d) m G+ x C3 y
2.3.2
* P) H K; `# n4 `* ySheet No.
0 R5 E% G$ u, r/ s395
* D) F$ ^5 q" ~7 u- n- hSubject:
3 k% R' \8 v l$ k0 sSeparation of TNV –3 and SELV
' \. v/ X4 m8 }/ I. S! T0 jcircuitry
4 K" [3 P' H! @: XKey words:
/ K! U! w! \8 T# w1 F3 G; e- Separation of TNV-3 circuit4 B1 r" N$ U) ~1 k$ s" G+ d5 c8 R) W
and SELV circuit. `% G, n0 d ]
Decision taken at the 39th
/ a$ f. _& O7 ]6 F7 f( z8 `meeting 2002
2 q$ f" G7 t& p+ L3 G% f3 ~+ r; a) HQuestion:
! r+ I! c, U9 I$ l" Z8 o1. Is it permitted to demonstrate that a TNV -3 circuit is adequately separated from a SELV circuit by
$ E- r/ K- `' h W7 i6 Lmeans of single fault testing, in the situation where the spacings do not meet the requirements for basic
* ~2 w# n1 j0 W$ R/ q: einsulation? (The dielectric strength test is still required under Subclause 6.2.1.)& d) J8 ]( n: `: Q/ c4 a* ~
2. If so, is it required under the compliance paragraph to short circuit the insulation between the TNVcircuit
+ H. k" T8 s. N3 W7 rand the SELV circuit at all points which do not meet the criteria for basic insulation, before3 p/ E K) b' X7 q9 H
carrying out the tests?
U- X+ C7 |+ d* J; _3. If short circuiting the insulation before carrying out fault tests results in the equipment passing the tests,) N! X5 B# e, z1 P, F
whereas carrying out the fault tests without short circuiting the insulation would result in the equipment
2 E ?- {* y9 Tfailing the test, should the insulation be short circuited?
7 Q6 T) p8 ^0 U( Y; B9 ^Rationale:( T/ k j* r! b' p! W
1. Paragraph 1 of Sub-clause 2.3.2 requires that separation between a TNV-3 and a SELV circuit be such, D& T- @1 N: u% h8 C, \5 S
that in the event of a single fault, the SELV circuit remains below TNV-3 limits. Paragraph 2 of Subclause* ^; u0 F7 u3 M9 @
2.3.2 states that basic insulation will achieve this, but other solutions are not excluded.3 F0 C2 i3 k6 B
Equipment is not required to meet either Paragraph 2 or 3. It can meet the single fault conditions stated( y+ Y8 d8 _ _2 ?) i& n6 g
in Paragraph one and in the compliance paragraph.
9 \0 a# A! ]) r3 Y2. According to the compliance paragraph, before carrying out the single fault tests, insulation which does
G& F9 M) o, R. gnot meet the requirements for basic insulation is short circuited. Presumably this does not mean that
* J& j$ H$ C, s8 R$ F( X( i* `short circuits are to be applied between all tracks and components in the entire TNV-3 and SELV
2 r3 V! \) b5 R# h) Fcircuitry which do not meet basic insulation, but that the insulation at the point where the TNV-3 circuit
: U$ Z" W, H0 s! ^) N E- K5 dmeets the SELV circuit is short-circuited.
. w# T% a/ \3 y3. It is possible to envisage a situation where short circuiting the insulation between TNV-3 and SELV' h. v. ^4 d" Y: A0 }0 R" Y
could cause the TNV-3 voltages to be lowered. Fault tests under this condition would not represent the! c* Y: b* }- [+ I3 R. p
worst case possible fault condition. ?' D2 ?/ J* ]5 L: L. j' X& F( C
Decision:
- x/ O& ?3 @) M( A- F* r$ ?1. It is permitted to demonstrate compliance with Subclause 2.3.2 by means of single fault testing.1 }- V P8 M4 z6 ^
The limits in 2.3.1.b) shall not be exceeded in normal or single fault conditions.7 d( x# t9 n9 K1 {
2. Before carrying out single fault testing of components and insulation, insulation between TNV-3 and* @% y% G( Z* X
SELV circuits not meeting the requirements of Basic insulation should be short circuited if this results in! N$ O l6 A$ r, @, c# ?$ z
a worst case voltage measurement at accessible parts of SELV and TNV-1 circuits, and at accessible) r r- ^3 _0 n. u% N( f
conductive parts during subsequent fault testing.7 Z1 W4 x0 X6 y( P0 \7 y7 E
3. If the single fault test would be more severe if carried out without short circuiting the insulation, the test
) L# z" ^6 c7 F0 A1 @should be done without short circuiting the insulation.. |5 z4 i" O% \1 ]1 T. z
9 D3 a% B0 W. Z7 W p
% |1 t {- ^6 ~' _ |
本帖子中包含更多资源
您需要 登录 才可以下载或查看,没有账号?注册安规
x
|