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Question. L, I1 y9 l Y! m& e/ I
In which way shall the temperature rise test be carried out on a device composed of two or more
! m8 l H+ d! o" xswitches, having the same or different pattern number mounted on a common body?' ?5 D8 D! v5 x4 C# m
The construction is allowed in note 1 of sub-clause 7.1.1, but the testing conditions are interpretable
$ ]! f8 Z3 K* I( i$ n2 nin different ways in clause 17.1.
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The temperature rise test shall be performed separately on each individual switch on condition that it
* o- |7 E: o5 ]3 ]8 s! M6 A1 F( Eis a single-phase switch. Q$ _4 u/ P F8 S
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