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Question$ o, t, B1 B! t, r! j
The first sentence of clause 3.4.3.1 of IEC 60384-14 states: ”Capacitors of each technology, rated U' O- i, n6 S. C6 U( u
voltage, class and sub-class shall be separately qualified”.
& M5 o0 o1 v) Z, y2 }2 R3 JIf it is requested to qualify a dual-class X/Y capacitor (e.g. X1:400 V, Y2:250V), is it permissible to3 ^; `- |. m1 G3 p
perform one type test only by applying for each individual test the highest test severity?
) ]. n0 K" K! U1 ]/ b9 {7 `, x: dTo qualify a dual-class X/Y capacitor, testing laboratories may have different interpretations of this
$ c* e A9 L& `sentence.
8 c( H7 g" Z$ s) R, cInterpretation a): Some testing laboratories test the same capacitor series once for X1 and once for
' {, p% N: s3 r& BY2 at the same time in separate type tests.* m# P$ L& o5 G s* R, r8 H; f6 m
Interpretation b): Other testing laboratories follow the opinion that the safety of the capacitors is also
/ [) r" J$ h+ m) g% r" R2 f0 fassured if a mixture of highest testing (peak) voltages of both sub-classes is used. This means worst
# @& r, P5 }( I% Qcase testing, covering both sub-classes for certification.5 j9 r. i6 f2 @; {6 m4 r7 b* t% h
Both interpretations may possibly lead to the result of compliance or non-compliance of the capacitor,1 S, K' [+ c+ F+ t% j! _# K% ^7 j
as in a) more samples are tested and in b) a single capacitor is more stressed.4 `7 Y7 H1 `* U7 c
From the technical point of view, it should be acceptable to perform one type test only by applying the9 @/ J" Y6 X; d% ^8 F
highest test severity for each test.
% N% f1 h( U& v* p2 I B6 fDecision$ j( {3 O }# m. v7 [
When a range of dual-class capacitors (X/Y) is qualified, it is allowed to perform one type test only, if
/ z0 B* t9 X- L9 Cthe highest severity of the X or Y class is applied in each respective test. d8 T: I2 P9 o2 [, I: h ?3 \9 Z
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