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Question
; w; c9 Z. J& W$ FThe first sentence of clause 3.4.3.1 of IEC 60384-14 states: ”Capacitors of each technology, rated; m, g" e8 o1 i1 b5 d
voltage, class and sub-class shall be separately qualified”.; O- a% X: P n% r2 j
If it is requested to qualify a dual-class X/Y capacitor (e.g. X1:400 V, Y2:250V), is it permissible to- P$ `% j7 Z2 O* b( w
perform one type test only by applying for each individual test the highest test severity?2 k/ X" c: M9 t1 N- F
To qualify a dual-class X/Y capacitor, testing laboratories may have different interpretations of this
+ l; }, C4 d" V C4 y7 z( r' }sentence.
( K/ ~5 V1 _& U/ z: C5 i2 IInterpretation a): Some testing laboratories test the same capacitor series once for X1 and once for& t4 S- n2 e6 V. x9 X/ @5 H V' S
Y2 at the same time in separate type tests.
( S) ~& S! W! N0 ~. a% bInterpretation b): Other testing laboratories follow the opinion that the safety of the capacitors is also9 {$ F& d9 o2 M! X4 o: G
assured if a mixture of highest testing (peak) voltages of both sub-classes is used. This means worst
; J! a( f1 V6 d% |, Rcase testing, covering both sub-classes for certification.6 A4 }6 L' ^% Y( L
Both interpretations may possibly lead to the result of compliance or non-compliance of the capacitor,
: T1 [& P& D. Q' q0 Xas in a) more samples are tested and in b) a single capacitor is more stressed.
! w! Q! q: w' q' DFrom the technical point of view, it should be acceptable to perform one type test only by applying the
7 Y9 k: Q# Q( n. `2 W8 b! Ehighest test severity for each test.' s2 k& n1 T }+ B( T
Decision1 e; B+ x+ ~6 o& b: L2 ~
When a range of dual-class capacitors (X/Y) is qualified, it is allowed to perform one type test only, if
$ T9 O+ l- ]% z+ |* {* r( [the highest severity of the X or Y class is applied in each respective test." p. u- B. C) C- g6 `5 K7 V/ u' Q( M9 `
; f/ ?1 e6 Q% L# e$ C2 y
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