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本帖最后由 chinatown 于 2017-1-7 11:25 编辑
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. }( N s B9 \+ R5 U' G3 zQuestion' b, V2 R( B1 R7 j
How many samples shall be subjected to the individual type tests according to clause 6.2 of IEC
# I2 G! l7 b( ]' [% `; F# ?; |60831-1 for shunt power capacitors?
- l4 y8 N1 ~- I# G+ j$ o- c5 u) IDecision3 K6 N" z) x% c# G" D. j" m
For the performance of a type test on shunt power capacitors according to IEC 60831-1 the following
7 b9 \. L7 x6 f# p, u gtype test schedule shall be applied:0 h% f D! e y- n6 y% ]# r* k
Type test schedule:
! P) z3 `. ^* P% K* N; ~Tests Subclause Number of samples to be inspected* }4 ?: s6 u/ C; _; b& m
Single-phase, w [, C2 [- }, X8 e0 I. M
units
6 X8 O6 R* ? mThree-phase units
" H$ d |9 X9 Y( E4 u≤ 10 kvar > 10 kvar
1 }1 K! H, t2 j2 `# N% B @Thermal stability test 13 1 1 1/ Z& o. ]# ]/ V1 F" L; W& n
Measurement of the tangent of the loss angle (tan δ)1 G5 M- o* I: m+ E/ Y! O
of the capacitor at elevated temperature4 O# A" L5 _# M
14 1 1 14 _( v. G* i: w5 M9 Z* @% _# A
Voltage test between terminals 9.2 5 5 30 r. W. o9 n7 d: V, V
Voltage test between terminals and container 10.2 5 5 3$ C" K* y f& ]4 g6 P) T3 { x8 b
Lightning impulse voltage test between terminals and
9 X4 ?. ]- F' L8 i9 zcontainer
8 S7 j$ I; A; S: w; T15 5 5 3
9 |' G% S) E# X& FDischarge test 16 3 3 3( b, ~( {% Z+ d$ X
Ageing test 17 5 3 2
) R( d9 E& {+ O6 _, hSelf-healing test 18 5 3 35 ^9 ^ n4 {9 B) }# v
Destruction test 19 5 3 2( w. t9 `, s7 r$ J, v+ T* Y5 [
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发表于 2017-1-7 11:22
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