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本帖最后由 chinatown 于 2017-1-7 11:25 编辑 $ r4 F; }1 A3 v c6 [3 V
2 \( r6 v" H- l9 [: a$ D9 p8 ~Question
: X; D0 v. l& [- pHow many samples shall be subjected to the individual type tests according to clause 6.2 of IEC
3 }. h0 c. n+ J8 q4 R60831-1 for shunt power capacitors?
' j* A, \4 A2 lDecision
5 z3 e4 m- e0 Y/ jFor the performance of a type test on shunt power capacitors according to IEC 60831-1 the following
& X3 ~% a9 u. \" ztype test schedule shall be applied:
3 O3 o$ ^& T; o4 u/ x8 y0 fType test schedule:
# |. I3 ^9 Q% Q+ }) E" O+ Z% Y* ETests Subclause Number of samples to be inspected
8 @6 T, F' j ~6 @. s' QSingle-phase R& @# L1 i* u( g+ Q
units7 T3 N2 z: \9 j
Three-phase units. n1 ^5 X! s/ A" D+ Y" [; g& d
≤ 10 kvar > 10 kvar D7 g, {4 I6 z% `# I' j% D ^
Thermal stability test 13 1 1 1
7 l$ i8 c. `/ s8 r1 G3 oMeasurement of the tangent of the loss angle (tan δ)
/ a" _ e$ \7 a$ x" tof the capacitor at elevated temperature$ T! S, L. P! K$ W
14 1 1 1: t r# Y: ]& L- s# M) W M9 g; W
Voltage test between terminals 9.2 5 5 3
% [2 g4 ]; O( I. }Voltage test between terminals and container 10.2 5 5 3 ^* \" G1 Z9 n, D2 Z
Lightning impulse voltage test between terminals and
9 _! _' v) v- z) _. [container5 z& z! @! M6 r" u* `% _% n* n+ H
15 5 5 3
5 N' \) F p/ |0 Z- gDischarge test 16 3 3 3
/ \- |( P1 }( F- S0 j( i! UAgeing test 17 5 3 2
: X! |/ C) K1 U$ H$ d0 I( v) B! k9 C9 DSelf-healing test 18 5 3 3, P1 R. {6 W- B3 w' F2 O
Destruction test 19 5 3 2! k+ s; \/ S, T L. Z% @
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发表于 2017-1-7 11:22
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