|
各位大神,
9 v$ ^# U$ b$ M4 g/ v0 ? 大家是怎么理解UL1598这18.16段话的?(我用红色标识了)* V* b# L0 E0 v/ \9 |
! K) A1 c! k ?& L
1 {( |9 ]; I0 K* ~
- o2 N7 R1 @) h+ }
18.1 Dielectric voltage-withstand
; ?$ v! y5 e! W6 P' m18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.
0 r1 {# ]3 d' b+ q18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied
) k3 g$ Y* R& Mbetween live parts and accessible non-current-carrying metal parts, including parts accessible only during
0 U! |! o5 h( E; i8 a6 }0 l5 V4 J5 t' Frelamping.
) n9 l b/ F1 w o( _' S% f7 u18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice
) A0 f( Q* e+ {+ l0 k+ R0 e! nthe rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at7 x9 s- Y0 @; m' j
1.414 times the AC potential denoted above.
6 R, ?+ K9 f7 H4 M) U) q- `0 m18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required
) X' A8 O. [; J/ i) l8 u6 dtest value is reached or breakdown occurs. During the test, any switches or other controls shall be in the
1 u. s9 Z, L, ^# r6 V* Z4 ION position.$ ^- K& W4 b( L, d5 z1 {
18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or
) e1 G+ ?5 D5 s7 q! ^decorative parts not likely to become energized shall not be required to be in place.
! c6 x4 D' f3 j/ }18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can
& }7 w& |1 k& Abe damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be
0 m1 w7 z/ l" w( r% h/ m6 Trearranged for the purpose of the test to reduce the likelihood of solid state component damage while
0 ?- m$ f* E6 u/ [4 Cretaining the representative dielectric stress on the circuit., w, z% q6 a& l6 ~
# b- R9 Z8 B' [: A
|
|