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各位大神,
* x- `! d; C- P7 x1 {5 \ 大家是怎么理解UL1598这18.16段话的?(我用红色标识了)
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: H1 w+ i6 p: {& a8 Y o i18.1 Dielectric voltage-withstand
/ N0 P/ _1 T, v g9 A18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.
5 w0 c A% i$ T+ j7 H6 f* z18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied
: O8 O' E7 i' Z" |# A3 \: ~between live parts and accessible non-current-carrying metal parts, including parts accessible only during
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18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice9 @+ N+ m) L' m, p( S2 O* ]1 G
the rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at
- ~# o! j& Q# D1.414 times the AC potential denoted above.
1 _7 L( `4 k: J J" O! E18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required& q( [ w+ b* h# ?( B! U
test value is reached or breakdown occurs. During the test, any switches or other controls shall be in the" J& ]* q+ i6 z, k: H
ON position.+ k0 ~. {+ Q0 ^
18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or8 u" k# e9 P8 L) E2 q
decorative parts not likely to become energized shall not be required to be in place.. K# B/ s1 Z( ?
18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can
$ ]" d* D& n7 ^: S6 }6 O. i8 b7 j; Fbe damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be
2 k; G# Y# _% l& c k8 |" Brearranged for the purpose of the test to reduce the likelihood of solid state component damage while
. \: W& {3 d: o4 Iretaining the representative dielectric stress on the circuit.
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