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各位大神, _) `7 r2 b8 U# l* M5 ?
大家是怎么理解UL1598这18.16段话的?(我用红色标识了): R) |% _0 x! G2 b' q
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18.1 Dielectric voltage-withstand
! I# n U4 G' U4 G: L. Z5 c6 n% W18.1.1 The dielectric voltage-withstand test apparatus shall be in accordance with Clause 19.20.
# I6 ^' X3 H" h/ _7 E18.1.2 A luminaire shall withstand for a period of 1 minute, without breakdown, a test potential applied! _- b& G* G' y/ Y. E
between live parts and accessible non-current-carrying metal parts, including parts accessible only during
8 N( X) i1 n& _/ I8 E. {, R! frelamping.
9 ~+ I9 ]0 R' ]18.1.3 The test potential shall be 1000 V AC for incandescent-type luminaires and 1000 V AC plus twice) \9 X: \. H- X8 q
the rated input voltage for all other types of luminaire. The test may be conducted using a DC potential at# I; C5 {9 D' M7 l0 o2 n4 k# D/ f
1.414 times the AC potential denoted above.
+ Q- l+ G# V6 u) k18.1.4 The applied potential shall be gradually increased from zero at a uniform rate until the required
# X: N# H$ g: h1 w. Z2 `5 I. htest value is reached or breakdown occurs. During the test, any switches or other controls shall be in the
! }# f g0 @& _4 oON position.3 ^3 {% Y/ x1 |; ^- R# x; N
18.1.5 The test shall be performed on a fully assembled luminaire. Non-current-carrying parts or2 x+ |. j! W$ g' |2 ~
decorative parts not likely to become energized shall not be required to be in place.
1 k% n# l( b Z. O18.1.6 Solid state components that are not relied upon to reduce the risk of electric shock and that can
2 ]% b! `% Z- ~) v. cbe damaged by the applied dielectric potential may be disconnected for the test. The circuitry may be* l- Z" O! A- f0 e
rearranged for the purpose of the test to reduce the likelihood of solid state component damage while9 {$ W; o5 y( q6 Z0 b
retaining the representative dielectric stress on the circuit.3 b- e% S* r2 E
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