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% _" x" N$ k9 ]4 p1 D8 y# H0 o" ^9 U3 n8 h, X7 W
| Capacitance
! } O7 X8 t, p- @3 F! b$ D | 6.3.1.39 L( `9 `' ~4 N
| 61010-1(ed.1);am1;am2
. B" s2 \- v4 {' r; W) \9 Y. j% ~ |
R, r* B- G! s3 r0 ~
. C$ ?7 T9 |5 l! t6 t0 BStandard:
& a% p0 d' I6 t7 U- RIEC 61010-
( H; P' j6 v- e4 K/ X1:1990+A1:1992+A2:1995
1 f, L7 D+ w: E0 A4 [Sub clause:' B- }& K& b1 |& b1 |" d; t2 n
6.3.1.3
3 w! X3 {0 F! ]- b! zSheet n. 302! z/ ], _1 _+ A3 O7 r* i
Page 1(1)
0 t9 f3 S% C5 c" e+ [# p# bSubject:
' s4 g( R( [3 `, b4 c) m* SCapacitance
) d1 e& {2 g0 vKey words:
+ B6 P2 j. p' v, z- Capacitance5 a) e5 x" d0 [1 `1 o2 ]' P1 t
- Charge
' w4 T q/ o0 A3 L2 }/ hDecision taken by1 r) P2 Y4 z4 X/ i+ _8 [# w$ S: i
ETF3 and confirmed
9 w$ i. ?+ G) bby CTL at its 38th
- c) z( K$ T3 o' M$ C$ ^. o$ _meeting, in Toronto7 a3 l; Y1 B j
Question:- z+ {! \" h$ E& c+ ^, h
How can the stored charge be measured, in particular where the circuit is complex?
' K, D& Z. D: }4 ?4 N8 {Decision and Explanation:
! h) `( a! {' L8 z" m7 J# q. d# [Only the charge accessible to the user is of concern under the standard. Therefore, where the3 X) h1 q- N7 Q2 }0 V d& f* z
circuit is complex, it is considered that a method of measurement from the accessible part is2 |* K* {$ x8 e
needed. It is, therefore, recommended that a procedure of discharge through a defined
" g" A* G' e' d1 @2 I# Sresistor is used, monitoring the voltage – time profile to provide a method of calculation of
" X0 z* T4 @! {& scharge.
9 n' i0 q: e1 FWhen this method is used it is requested that details are recorded in the report for the benefit
* u0 C; O' k3 G/ Aof CB members.
8 s4 Y% x( n! }# p2 {6 m: U- dThe method described in IEC 60950 Subclause 2.1.10 is recommended./ X& y: x+ G5 A0 ?. f; {
. J% g5 G9 g1 k0 J
1 t& S2 i: p) ~: ~ l* R0 f* m4 c7 O: s
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