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% C+ q5 Y( q; b, ?
+ Z9 q" F- Y( k# c | Capacitance( s5 v" }! j! v ?( r
| 6.3.1.3/ `9 f1 ^& O2 Y6 m6 U- t
| 61010-1(ed.1);am1;am2
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/ D# @/ K( N0 N+ s) ]Standard:4 H* B7 N3 k, G4 L
IEC 61010-
2 B8 G5 t5 r. }- J) l( A, l1:1990+A1:1992+A2:1995
' s: {+ j n2 h: f' l3 x; H! j( p, z8 bSub clause:" X5 \9 y7 a. J6 \4 @
6.3.1.3
, d) X4 B( H: E9 O O2 H: ISheet n. 302$ S; I( ~: F9 M5 H% [1 p: }
Page 1(1)1 {7 w4 G0 _/ `1 [! p q' H4 s
Subject:
. k/ R4 y2 ^1 r4 i3 dCapacitance: K: D& y% P7 b5 {3 W$ H) ]
Key words:
4 d2 D- L% W7 X% s* [& O5 h- Q- ]- Capacitance- t% B( b1 r/ e4 w4 Z0 i
- Charge) _6 D' L. h2 t2 W7 f6 \, t' u! p
Decision taken by
4 ~* N6 j2 T! t7 eETF3 and confirmed) ~- z7 i/ j/ ~
by CTL at its 38th- j& ~8 u% K. F: _5 n
meeting, in Toronto: h; n5 ]8 G: b: E4 {0 h
Question:8 r" Y0 S9 o1 V7 l* ^! }8 k
How can the stored charge be measured, in particular where the circuit is complex?
" J7 T' L. y+ j. D p7 pDecision and Explanation:' F1 G2 ^ H6 e, |% p1 D' t" D
Only the charge accessible to the user is of concern under the standard. Therefore, where the
9 ~/ a! `1 Q N; qcircuit is complex, it is considered that a method of measurement from the accessible part is
, i1 b/ L4 X) i. V3 @8 Fneeded. It is, therefore, recommended that a procedure of discharge through a defined0 K4 j I% }% m1 ^
resistor is used, monitoring the voltage – time profile to provide a method of calculation of+ F1 Z ?$ {4 Q* Z5 S# ^
charge.. E0 J/ P. c9 R
When this method is used it is requested that details are recorded in the report for the benefit
, x, t$ J9 P% ^- ~of CB members.0 N) y% g) Y" t4 |) t J( W, a4 c
The method described in IEC 60950 Subclause 2.1.10 is recommended.
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