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| DSH 405
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" {; A z# |+ M6 I3 E+ n | Leakage current in secondary circuits0 [$ o1 v& J' a2 H7 O
| 17g)
" J" \* d8 J3 F, X | 60601-1(ed.2);am1;am2: j) [7 \9 U8 b4 ^4 M
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5 i9 I$ f. Q$ iStandard(s)- (year and edition):
( L, i& `7 U3 U2 Q1 r: v8 U. |( |# sIEC 60601-1:1988 Ed.2 Am1+Am29 q; B: z9 }& ?/ t9 A& ~6 p
Sub clause(s): 17 g)
: T) `. n: l" F; S4 vSheet n°: DSH-405
# J% A0 P5 d6 X& G) sSubject: Leakage current in secondary circuits
; J: S+ V( G6 U: ]5 v: FKey words: Leakage current, secondary circuit
0 N; ~+ V8 t, N& e) nConfirmed by CTL at its 39th meeting, in Cologne
% P8 P* A3 t$ N( q2 XQuestion:
& q( v' N& s6 ~2 z3 ]# S2 JIf secondary circuit impedances limit the leakage current, is further investigation of secondary* x2 E, `; b# Q" q
circuits required? (refer to sub-clause 52.5).
" a* ]/ l8 N* Q, n1 V! eDecision:
0 o; o, q9 h; b/ O( l3 e# Z2 i, I; mSecondary circuits providing protective means after short-circuiting of inadequate AIR
) t; G- S" ^4 S9 BCLEARANCE and CREEPAGE DISTANCE must be investigated. Failure of components in# t* n2 m+ _. F% M7 N7 y
these circuits shall be investigated as a SINGLE FAULT CONDITION. Failure of such! t6 e" s9 m- N; Y- W0 B
components shall be investigated as a SINGLE FAULT CONDITION.
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