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[POW] DSH 659 Problem of setting a current applied to ACB of high current rating in in

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发表于 2012-11-7 18:18 | 显示全部楼层 |阅读模式
广东安规检测
有限公司提供:
DSH 659
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Problem of setting a current applied to ACB of high current rating in instantaneous tripping" B# i" L3 m0 O8 q5 ]  D0 |% y
8.3.3.1.2* V# }# m0 _9 J0 ^
60947-2(ed.4)
( y6 l; R1 B3 B7 }) r# ]6 a

* A8 p6 d4 ?* s, `  jStandard-
3 I8 J4 U/ m! x4 V6 T3 B9 cIEC 60947-2 (2006-04, 4th Ed.)
3 [2 e) i6 s4 \& T- b5 oSub clause(s):4 b5 k5 i4 ?) f
8.3.3.1.2! N) D, z% T2 c+ Q; z
Sheet:/ q$ n7 `9 V( {% P6 q
DSH 659( W  V$ S( s0 j5 K
Subject:3 A+ }$ o% m& {! n3 Y: q% o7 t6 f
Problem of setting a current applied to ACB of
' T+ n" }5 m$ G" Thigh current rating for instantaneous tripping.
; _1 w- ^: m0 J. A2 A9 VKey words:( D  y$ h7 X, \& A* h# y
Trip limits &7 w6 t' g. H) d' x  t
characteristics. z2 X, t$ [' [0 @. `: R
Approved at4 \) e* n4 m; H7 c8 `: W
the 45th CTL
% G( N, c0 L5 fPlenary
% {; R6 p& ?" _( Y+ {# M; QMeeting in! C/ B9 m- z! E. `5 [$ [# F
Prague in 2008' x' ~. q5 A+ t# T, R* J
Question:$ O* w, k* q$ ~# z8 n& ^4 X
According to 8.3.3.1.2, when the over-current opening release is a built-in part of the
& O# @3 [- q" d0 n6 t3 M4 i0 O8 D: ]circuit breaker, it shall normally be verified inside the corresponding circuit breaker.' }) j1 e1 j. Z6 H3 i( A. ~1 k
For example, in case an air circuit-breaker (ACB) has a rating of 6300 A with an
3 M  j' m1 j. D& e' \/ l. Uinstantaneous trip release up to 16 In, do we have to apply 80640 A (16 In x 80 %)2 W( [, v' l7 G/ H
and 120960 A (16 In x 120 %) to the main circuit of ACB by use of a high power) U  r7 {& u* m# d1 {+ _6 U. @
testing facility when performing the trip test of SEQ. I?% a2 T7 P0 ^1 W5 Z- v' f. g) Y% o& a
Rationale:5 y# q5 U. ^5 z" |3 [
It is not so easy to conduct the instantaneous trip test using the high currents
, }4 M. c) p3 c  }% ^/ I& Q4 D1 f1 w0 nmentioned above, because to do so a high power testing facility is required. In# l* y' p9 W% T1 d1 P$ f- Q. H
addition ACBs often have several ratings, which are determined by the specification6 g* M! r; r1 Z
of the CT in combination with the trip unit, and the trip unit is usually the same for all
& b: P, }- r* S) E* ^6 \models.  a/ n' O( G- H; [
So some accredited testing laboratories have performed this test by applying the
1 u$ \. z7 k% ?/ c8 ksecondary current of CT (normally 5 A) to the input of an overcurrent release. This
0 R1 C2 E: j" h  t! b1 erelease is connected to operating mechanism of contacts to check the mechanical
6 e* P% I$ u9 ]9 M9 L% jopening of an ACB. But by use of this method, we bypass possible problems such
9 x$ k% p3 e; {% k# p  u+ aas CT saturation, thermal and EMC influence on ACB, especially on single-pole: l+ r" r/ _. S+ q+ G. l
connection.0 [& ]% S& N8 B3 l9 H& M
Decision:, O: A( V# S5 c+ T5 d2 r1 e$ a. D2 e
The secondary current of the CT (reduced current, 5 A, for example) may be used
7 }* z( s7 s- G+ Rfor trip tests of ACBs integrated with electronic OCR for all ratings of In, but only for
7 L6 k: C- c* N, H( f( I) N$ S0 h1 s: Ksub-clause 8.3.3.1.2 of SEQ I.0 R0 [, R7 A6 E+ u- J
But in addition, followings items shall be verified to fully cover the safety aspects of0 Y2 N! ?# P) o
the standard:- `' K8 l( d: p& N! X
1. The conformity of the performance (at least turn ratio and composite error); O5 w/ H1 B0 q" C! n9 n. V; P
of the CT or Rogowski coil, if any, shall be verified by specifications, test
! a- G+ c/ k8 w0 B9 ~. Zreports or certificates. All CTs of the circuit-breakers of the given frame3 x, e! m. i8 F0 @/ f5 I; z
size have to show the same performance characteristic.
; c+ s3 `  X  g% O2. The single pole short-circuit test with a current equal to 80 % of the
& Z( U& i& u. x& W* z" Tmaximum current setting of the instantaneous release and equal to 120 %
  d& r% T/ Y% l$ Nof the maximum current setting of the instantaneous release shall be
6 d, a/ T, C4 X0 `% Z+ y/ Kperformed at any convenient voltage with the current in the main poles of
2 P1 ?  ?5 Q/ f& @* q. {the circuit-breaker. The other tests required by the standard may be
) a( T( \" @. @6 Lconducted by use of a simulated input signal to the tripping unit.
! f6 }. e' s/ b5 H9 y9 f
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