CE标准/EN 55014升级了吗？

2iso

广东安规检测
有限公司提供：

小型摆管淋雨试验机

IPX5X6X7喷水试验机

1000L恒温恒湿箱

各种试验指现货

可程式恒温恒湿试验箱

水平垂直燃烧机

自动卷线器试验机

耐划痕试验机

各种灯头量规现货

灼热丝试验机现货

GB1002插头量规

IPX1-X7淋雨现货

IEC61347/UL935镇流器热试验箱

灯具防风罩

IK冲击试验机

UL498插头插座量规

VDE0620插头插座量规

稳定性试验台

家电温升测试角

针焰试验机现货

热电偶焊机现货

家电125mm试验指

E12灯头量规

无绳壶无绳电熨斗插拔寿命试验机

IEC60335试验指甲

引用第9楼Naomi于2008-12-21 15:56发表的  :
6 H4 l; ^! m( o請參考附件

, C7 |, k" }/ j9 g' F' m其中,
DOP : 表示發行日期
% k* t, {4 Z4 A7 @5 J; D通常DoP 之後就可以開始使用
2 R* X7 X3 A2 y2 S8 e.......

可以贴上链结网址吗? 谢谢.

william_hp

有没有附件传上来

daisy_1208

引用第10楼2iso于2009-03-11 08:21发表的  :


2 t) E9 x2 k) b3 _. U
可以贴上链结网址吗? 谢谢.

4 \: ~% h. ]# _, Nhttp://tcelis.cenelec.be/pls/por ... ;p_arg_values=21247

louislin

由于我的标准上有公司名字，就不直接贴上了，差异部分如下

; F& ^0 u$ }; j) c" xPage 9
1 Scope and object
+ C8 {  N# w: S, V& }8 _Replace the title of this clause by “Scope”
" R+ u: S. }: L; A  f1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
Page 11
! g3 j) G9 P$ m. ~3 M2 Normative references
  [7 ^) s' ~, BReplace the text by the following:
+ T6 I& J: Y. TThe following referenced documents are indispensable for the application of this document.
9 k* b+ i6 V4 fFor dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
Electromagnetic compatibility
$ ]3 ?) w( a0 ]1 G! F5 a
# m, ]0 A1 U6 }) `1 m/ Z, C
# E4 \: q! _: {CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
measurement techniques – Electrostatic discharge immunity test
Amendment 1:1998
9 [7 l  s9 @2 y1 F: lAmendment 2:20001
# A) @/ a& I3 k8 |! FIEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
7 b; {* w8 Y8 r3 u2 z  ^! |Amendment 1:20072
  @; M0 v9 [. G5 bIEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
5 l. m3 a; d8 R( ~- O) r7 A, Mmeasurement techniques – Electrical fast transient/burst immunity test
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
measurement techniques – Surge immunity test
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
2 s2 ~' ~" n2 s' [; o0 K+ Bfields
# r4 ~# l+ O  a: p' K% DAmendment 1:2004
Amendment 2:20063
- Z! o7 M# }* K5 [* O+ nIEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
2 _2 h* }, {2 l; y* Dmeasurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
2 o6 t  n' `" k0 C' W4 j. E& JCISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
, q. B) V9 d8 t# j" ]9 yelectric tools and similar apparatus – Part 1: Emission
Page 13
1 u. S# O& i& Y: K% _3 Definitions
% T" D8 D9 d+ I2 C9 mReplace the title of this clause by “Terms and definitions”.
Replace the first paragraph by the following:
For the purposes of this document, the terms and definitions related to EMC and related
2 ]& p* @, c. W& d5 V$ aphenomena found in IEC 60050-161, as well as the following terms and definitions apply.
Add the following new definition:
4 Z6 ^6 a- f: j/ d4 r! n3.18
& b  k! s! k; I4 s% vclock frequency
" r7 ~8 o5 w- s: Z- p; C) T* X3 Y, Y- gfundamental frequency of any signal used in the device, excluding those which are solely
used inside integrated circuits (IC)
! I& y8 \3 B- K( h8 N1 U1 ]NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
from lower clock oscillator frequencies outside the IC.
___________
/ f0 \% G* \' B- t- x1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
! ^* s1 Y# S  \) C- F2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
6 f7 Q1 I2 e! g3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.

1 @: \5 x; w3 ], o! O# `
: N5 s" Y8 ]& q  ~9 b2 N' f– 4 – CISPR 14-2 Amend. 2 © IEC:2008
% p$ n" S' J8 w$ G1 PPage 13
4 Classification of apparatus
1 O0 D; z: ]* N) n, A. Z4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
; F; ^: l. W$ g; rPage 15
5 Tests
4 a6 v; F4 c. S$ I" B- G4 iThroughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
Page 21
5.6 Surges
: P+ r4 P( n5 {2 E; o; HTable 12 – Input a.c. power ports
% i  c+ ~& [8 x8 t$ r  p2 F) ?* BIn the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
$ \% Y  y: o% w+ q, n9 I"Line-to-Line with 2 Ω Impedance".
After Table 12, add the following paragraph as a new second paragraph:
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
6 c, z7 a6 z: {) {' T: h9 sequipment under test, and the negative pulses are applied 270° relative to the phase angle of
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
& P# H. a0 N5 e7 O' U3 fgiven in Table 12 are not required.
% T% M6 G% n( n* ^  [5.7 Voltage dips and interruptions
Table 13 – Input a.c. power ports
; q0 @6 \! y3 M: GReplace the existing Table 13 by the following new Table 13:
Table 13 – Input a.c. power ports
" w# |8 |% H5 L1 c7 O9 NDurations for voltage dips
8 O: e7 C& o+ `3 ^8 TEnvironmental Test set-up
: h6 R. h) {0 I' A5 jphenomena
Test level
in % UT
$ V& \% Z/ d6 F50 Hz 60 Hz
Voltage dips
! h: K3 f  ?! U# w( ^- win % UT
100
60
& x# ^9 j2 Y4 H% Y& e0 [30
4 @4 q# j* y2 f2 t0
5 S1 M) Q6 t+ K; n1 E; U. f7 g40
. V' S" D# [" o  F70
0,5 cycle
/ ^, Q# J+ y: ~$ l10 cycles
25 cycles
. X: c+ _. |3 Y0,5 cycle
' b5 b8 P  M4 P; P; b9 v7 k; g12 cycles
30 cycles
- C; h) H- i# FIEC 61000-4-11
Voltage change shall
% p7 L0 a# w% z$ @4 ^( g( [occur at zero crossing
) z; n2 g2 E! l) t* b: @+ [9 w0 d) UUT is the rated voltage of the equipment under test.


CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
Page 27
8 Conditions during testing
" n0 G9 C5 m) J- U! ~" a8.1 Replace the first paragraph by the following paragraph:
1 g- Z$ F# Q0 e! _" OUnless otherwise specified, the tests shall be made while the apparatus is operated as
) O5 Q3 w2 b7 G! H; g1 fintended by the manufacturer, in the most susceptible operating mode consistent with normal
use.
% i3 U) }9 s7 c8.4 Delete the second sentence.
8.7 Delete this subclause.
8.8 Renumber this subclause as 8.7
! n, j8 W+ P& L4 m4 `Page 29
9 Assessment of conformity
9.2 Statistical evaluation
Replace the existing Note by the following:
NOTE For general information on the statistical consideration in the determination EMC compliance, see
. R$ `6 o& a( [. XCISPR/TR 16-4-3.
Page 31
10 Product documentation
Delete this clause.
. ]4 y; l' N7 n  n6 O2 L( Y7 [4 NBibliography
3 B, `+ W1 z6 C, AReplace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
8 ~, k( T) C: C% @/ O# v3 k+ Tmethods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
the determination of EMC compliance of mass-produced products (only available in English)

honglipardon

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