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IEC (EN) 61347-2-3 - Year 2004
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GB-19510.4-2009
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Clause 17.1 + A6 H( x% q) j& k) G
3 q" Z+ n5 ~/ m2 D% m) N. |17 Behaviour of the ballast at end of lamp life; H/ l% o% Y3 D2 C' |2 {
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17.1 End of lamp life effects
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At the end of lamp life the ballast shall behave in such a way that no overheating of lamp cap(s occurs at any voltage between 90% and 110% of the rated supply voltage.
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9 s" ^1 z2 p' V4 ] For the test simulating end of lamp life effects, three tests are described:
, r; w# T9 Y! |; o/ A$ Fa) asymmetric pulse test (described in 17.2);
: K3 D0 b' P% Lb) asymmetric power dissipation test (described in 17.3);
8 E+ Z& m+ _: V6 [3 e5 d8 O% c& b) ]c) open filament test (described in 17.4). 6 d3 Y# Q% }; X) P' Q: {8 a
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Any of the three tests may be used to qualify electronic ballasts. The ballast manufacturer shall determine which of the three tests will be used to test a given ballast based on the design of that particular ballast circuit. The chosen test method shall be indicated in the ballast manufacturer’s literature.
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' i, }1 d& S: f' v NOTE Checking ballasts against their capability to cope with the partial rectifying effect is recommended by IEC 61195, Annex E, and IEC 61199, Annex H.& \! O3 X; Y6 ?' k0 {# F
Lamps used in the ballast test circuits shall be new lamps seasoned for 100 h. |
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