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IEC (EN) 61347-2-3 - Year 20045 `1 g# q$ ] j/ @( I
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GB-19510.4-2009' y* o. P6 U( q. ~+ d
http://www.angui.org/read.php?tid-65084-keyword-19510.html: E2 K$ W8 a4 f% `0 ?, u7 U
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Clause 17.1
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17 Behaviour of the ballast at end of lamp life
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% ?7 k& f: {9 C/ r5 u17.1 End of lamp life effects
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At the end of lamp life the ballast shall behave in such a way that no overheating of lamp cap(s occurs at any voltage between 90% and 110% of the rated supply voltage.' M! L) {' _/ n6 ^9 r# o$ [
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For the test simulating end of lamp life effects, three tests are described:
! C- X+ B& t: Q/ t5 Ia) asymmetric pulse test (described in 17.2);& `: L/ f. Y8 `6 I$ s- h6 k
b) asymmetric power dissipation test (described in 17.3);
: j8 i9 X) \4 L. Q+ {* a5 Uc) open filament test (described in 17.4).
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Any of the three tests may be used to qualify electronic ballasts. The ballast manufacturer shall determine which of the three tests will be used to test a given ballast based on the design of that particular ballast circuit. The chosen test method shall be indicated in the ballast manufacturer’s literature.' k1 S+ ^( b& Q K/ Z0 y
+ F& \- ?% c4 X0 l NOTE Checking ballasts against their capability to cope with the partial rectifying effect is recommended by IEC 61195, Annex E, and IEC 61199, Annex H.! {& j# i) v4 n/ W
Lamps used in the ballast test circuits shall be new lamps seasoned for 100 h. |
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